Structural, ferroelectric and optical properties of Bi2VO 5.5 thin films deposited on platinized silicon {(100) Pt/TiO 2/SiO2/Si} substrates

Applied Physics A: Materials Science and Processing

Volumn 91, Issue 4, 2008, Pages 693-699

  Kumari, N ^a   Krupanidhi, S B ^a   Varma, K B R ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; LASER ABLATION; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; SILICON; SPECTROSCOPIC ELLIPSOMETRY; SURFACE MORPHOLOGY;

BISMUTH VANADATE; DIELECTRIC FUNCTIONS; LORENTZ MODELS; MULTILAYER ANALYSIS; WAVELENGTH RANGE;

THIN FILMS;

EID: 43449118669     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4509-z     Document Type: Article

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