Spectroscopic-ellipsometry characterization of the interface layer of PbZr0.40Ti0.60O3/LaNiO3/Pt multilayer thin films

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1152-1157

  Hu, Z G ^a   Huang, Z M ^a   Wu, Y N ^a   Wang, G S ^a   Meng, X J ^a   Shi, F W ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EXTINCTION COEFFICIENT; FILM THICKNESS; MECHANICAL LOSS; OPTICAL CONSTANTS;

AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; FATIGUE OF MATERIALS; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC); SOL-GELS; SURFACE ROUGHNESS;

THIN FILMS;

EID: 4344579070     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1761160     Document Type: Article

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