메뉴 건너뛰기




Volumn 2, Issue , 2004, Pages

A maximum total leakage current estimation method

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; CONSTRAINT THEORY; ERROR ANALYSIS; ESTIMATION; INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR JUNCTIONS;

EID: 4344715582     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (22)
  • 2
    • 0043197432 scopus 로고    scopus 로고
    • Subthreshold leakage modeling and reduction techniques
    • San Jose, CA, Nov. 10-14
    • Jams Kao, Siva Narendra and Anantha Chandrakasan, "Subthreshold Leakage Modeling and Reduction Techniques", In Proceeding of ICCAD, San Jose, CA, pp28-34, Nov. 10-14, 2002.
    • (2002) Proceeding of ICCAD , pp. 28-34
    • Kao, J.1    Narendra, S.2    Chandrakasan, A.3
  • 3
    • 0042090415 scopus 로고    scopus 로고
    • Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling
    • Anaheim, California, USA, June 2-6
    • Saibal Mukhopadhyay, Arijit Raychowdhury, and Kaushik Roy, "Accurate Estimation of Total Leakage Current in Scaled CMOS Logic Circuits Based on Compact Current Modeling", DAC'03, Anaheim, California, USA, pp169-174, June 2-6, 2003.
    • (2003) DAC'03 , pp. 169-174
    • Mukhopadhyay, S.1    Raychowdhury, A.2    Roy, K.3
  • 4
    • 0031623626 scopus 로고    scopus 로고
    • Estimation of standby leakage power in CMOS circuits considering accurate modeling of transistor stacks
    • Z. Chen, et.al., "Estimation of Standby leakage Power in CMOS Circuits Considering Accurate Modeling of Transistor Stacks". ISLPED'98, pp239-244, 1998.
    • (1998) ISLPED'98 , pp. 239-244
    • Chen, Z.1
  • 5
    • 85013368162 scopus 로고    scopus 로고
    • Maximum leakage power estimation for CMOS circuits
    • Como, Italy, March 4-5
    • S. Bobba, I. N. Hajj, "Maximum Leakage Power Estimation for CMOS Circuits", Proceedings of IEEE VOLTA99, Como, Italy, pp116-124, March 4-5, 1999.
    • (1999) Proceedings of IEEE VOLTA99 , pp. 116-124
    • Bobba, S.1    Hajj, I.N.2
  • 6
    • 84874424103 scopus 로고    scopus 로고
    • Leakage power estimation and minimization in VLSI circuits
    • W. Shiue, "Leakage Power Estimation and Minimization in VLSI Circuits", ISCAS'01, 2001, pp.l78-181.
    • (2001) ISCAS'01
    • Shiue, W.1
  • 7
    • 0036374228 scopus 로고    scopus 로고
    • Leakage-tolerant design techniques for high performance processors (Invited paper)
    • San Diego, California, USA, P28, April 7-10
    • Vivek De, "Leakage-tolerant design techniques for high performance processors (Invited paper)"[J], Proceedings of 2002 International Symposium on Physical Design, San Diego, California, USA, P28, April 7-10, 2002.
    • (2002) Proceedings of 2002 International Symposium on Physical Design
    • De, V.1
  • 8
    • 4344597132 scopus 로고    scopus 로고
    • Ultra low -leakage power strategies for Sub-1 V VLSI: Novel circuit styles and design methodologies for partially depleted silicon-on-insulator (SOI) CMOS technology
    • New Delhi, India
    • Koushik K Das, Richard B Brown, "Ultra Low -Leakage Power Strategies for Sub-1 V VLSI: Novel Circuit Styles and Design Methodologies for Partially Depleted Silicon-On-Insulator (SOI) CMOS Technology", Proceedings of the 16th International Conference on VLSI Design (VLSI 03), New Delhi, India, pp291-296, 2003.
    • (2003) Proceedings of the 16th International Conference on VLSI Design (VLSI 03) , pp. 291-296
    • Das, K.K.1    Brown, R.B.2
  • 9
    • 0035694264 scopus 로고    scopus 로고
    • Impact of gate direct tunneling on circuit performance: A simulation study
    • Dec.
    • C.-H. Choi, et al., "Impact of Gate Direct Tunneling on Circuit performance: a Simulation Study", IEEE Tran. on Electron Devices, Dec. pp2823-2829, 2001.
    • (2001) IEEE Tran. on Electron Devices , pp. 2823-2829
    • Choi, C.-H.1
  • 11
    • 0042196141 scopus 로고    scopus 로고
    • Simultaneous subthreshold and gate-oxide tunneling leakage current analysis in nanometer CMOS design
    • Dongwoo Lee, Wesley Kwong, David Blaauw, and et al. "Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer CMOS design", in 4th International Symposium on Quality Electronic Design (ISQED), pp287-292, 2003.
    • (2003) 4th International Symposium on Quality Electronic Design (ISQED) , pp. 287-292
    • Lee, D.1    Kwong, W.2    Blaauw, D.3
  • 12
    • 0041589378 scopus 로고    scopus 로고
    • Analysis and minimization techniques for total leakage considering gate oxide leakage
    • Anaheim, California, USA, June 2-6
    • Dongwoo Lee, Wesley Kwong, David Blaauw, and et al. "Analysis and Minimization Techniques for Total Leakage Considering Gate Oxide Leakage", DAC'03, Anaheim, California, USA, pp175-180, June 2-6, 2003.
    • (2003) DAC'03 , pp. 175-180
    • Lee, D.1    Kwong, W.2    Blaauw, D.3
  • 13
    • 1542329235 scopus 로고    scopus 로고
    • Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation
    • Seoul, Korea, August 25-27
    • Saibal Mukhopadhyay, Kaushik Roy, "Modeling and Estimation of Total Leakage Current in Nano-scaled CMOS Devices Considering the Effect of Parameter Variation", ISLPED'03, Seoul, Korea, pp172-175, August 25-27, 2003.
    • (2003) ISLPED'03 , pp. 172-175
    • Mukhopadhyay, S.1    Roy, K.2
  • 14
    • 0030146154 scopus 로고    scopus 로고
    • Power dissipation analysis and optimization of deep submicron CMOS digital circuits
    • May
    • R. X. Gu and M. I. Elmasry, "Power Dissipation Analysis and Optimization of Deep Submicron CMOS Digital Circuits"[J], IEEE Journal on Solid State Circuits, vol. 31, No. 5, pp887-893, May 1996.
    • (1996) IEEE Journal on Solid State Circuits , vol.31 , Issue.5 , pp. 887-893
    • Gu, R.X.1    Elmasry, M.I.2
  • 15
    • 85013368162 scopus 로고    scopus 로고
    • Maximum leakage power estimation for CMOS circuits
    • Como, Italy, March 4-5
    • S. Bobba and I. N. Hajj, "Maximum Leakage Power Estimation for CMOS Circuits", Proceedings of IEEE VOLTA99, Como, Italy, pp116-124, March 4-5, 1999.
    • (1999) Proceedings of IEEE VOLTA99 , pp. 116-124
    • Bobba, S.1    Hajj, I.N.2
  • 19
    • 0023401686 scopus 로고
    • BSIM: Berkeley short-channel IGFET model for MOS transistors
    • Aug.
    • B.J.Sheu, et al., "BSIM: Berkeley Short-Channel IGFET Model for MOS Transistors", IEEE Journal of Solid-State Circuits, vol.22, pp558-566, Aug. 1987.
    • (1987) IEEE Journal of Solid-state Circuits , vol.22 , pp. 558-566
    • Sheu, B.J.1
  • 21
    • 4344680881 scopus 로고    scopus 로고
    • http://www-device.eecs.berkeley.edu/~ptm/
  • 22
    • 4344568471 scopus 로고    scopus 로고
    • http://www.erc.msstate.edu/mpl/distributions/scmos/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.