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Volumn 354, Issue 19-25, 2008, Pages 2632-2636

n-PS/a-Si:H heterojunction for device application

Author keywords

Amorphous semiconductors; Nanocrystals; Porosity; Raman scattering; Sensors

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOCRYSTALS; OXYGEN SENSORS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POROSITY; POROUS SILICON; RAMAN SCATTERING;

EID: 43049148311     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.09.115     Document Type: Article
Times cited : (6)

References (19)
  • 1
    • 0004140205 scopus 로고    scopus 로고
    • Canham L.T. (Ed), The Institution of Electrical Engineers, London
    • In: Canham L.T. (Ed). Properties of Porous Silicon, IEE INSPEC (1997), The Institution of Electrical Engineers, London
    • (1997) Properties of Porous Silicon, IEE INSPEC
  • 19
    • 43049109585 scopus 로고    scopus 로고
    • R. Prabakaran, H. Águas, I. Pereira, E. Elangovan, E. Fortunato, R. Martins, I. Ferreira, Mater. Sci. Forum, in preparation.
    • R. Prabakaran, H. Águas, I. Pereira, E. Elangovan, E. Fortunato, R. Martins, I. Ferreira, Mater. Sci. Forum, in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.