Optical and microstructural investigations of porous silicon

Bulletin of Materials Science

Volumn 28, Issue 3, 2005, Pages 219-225

  Prabakaran, R ^a   Kesavamoorthy, R ^a   Singh, Alok ^b  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b LOYOLA COLLEGE   (India)

Author keywords

High resolution transmission electron microscopy; Photoluminescence; Porous silicon; Quantum confinement; Raman scattering

Indexed keywords

CRYSTALLINE MATERIALS; ETCHING; HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT EMITTING DIODES; MICROSTRUCTURE; OPTICAL PROPERTIES; PHONONS; PHOTOLUMINESCENCE; RAMAN SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

BLUE SHIFTING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); OPTICAL PHONONS; QUANTUM CONFINEMENT;

POROUS SILICON;

EID: 20844455053     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02711251     Document Type: Article

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