Three-dimensional analysis of spontaneous surface instability and pattern formation of thin soft films

Journal of Applied Physics

Volumn 103, Issue 8, 2008, Pages

  Huang, Shi Qing ^a   Li, Bo ^a   Feng, Xi Qiao ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BIFURCATION (MATHEMATICS); FILM THICKNESS; INTERFACIAL ENERGY; MATHEMATICAL MODELS; THREE DIMENSIONAL; VAN DER WAALS FORCES;

ELASTIC PROPERTIES; INTERACTION ENERGY; PATTERN FORMATION; SURFACE INSTABILITY;

THIN FILMS;

EID: 43049122131     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2903892     Document Type: Article

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