Pattern instability of a soft elastic thin film under van der Waals forces

Mechanics of Materials

Volumn 38, Issue 1-2, 2006, Pages 88-99

  Huang, Shi Qing ^a   Li, Qun Yang ^a   Feng, Xi Qiao ^a   Yu, Shou Wen ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Morphology evolution; Soft matter; Stability and bifurcation; Thin film; Van der Waals forces

Indexed keywords

FINITE ELEMENT METHOD; INTERFACIAL ENERGY; THIN FILMS; VAN DER WAALS FORCES;

ELASTIC THIN FILMS; SURFACE INTERACTIONS;

ELASTICITY;

EID: 27744528296     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechmat.2005.05.012     Document Type: Conference Paper

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