Surface stability and evolution of biaxially strained epitaxial thin films

Applied Physics Letters

Volumn 87, Issue 12, 2005, Pages 1-3

  Zhang, Y W ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EPITAXIAL GROWTH; FINITE ELEMENT METHOD; PERTURBATION TECHNIQUES; STRESS ANALYSIS; SURFACE STRUCTURE;

STRESS-INDUCED SURFACE DIFFUSION; SURFACE STABILITY; WAVELENGTH;

THIN FILMS;

EID: 28344451898     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2053367     Document Type: Article

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