Near-edge x-ray absorption fine structure measurements using a laboratory-scale XUV source

Journal of Physics D: Applied Physics

Volumn 41, Issue 10, 2008, Pages

  Peth, Christian ^a   Barkusky, Frank ^a   Mann, Klaus ^a  

^a LASER LABORATORIUM GÖTTINGEN E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; KRYPTON; LASER PRODUCED PLASMAS; LIGHT EMISSION; THIN FILMS; ULTRAVIOLET RADIATION;

BROAD-BAND EMISSION; FLAT-FIELD SPECTROMETER; PLASMA SOURCE;

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

EID: 43049089762     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/10/105202     Document Type: Article

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