Time of flight photoelectron spectroscopy with a laser-plasma x-ray source

Applied Physics Letters

Volumn 69, Issue 2, 1996, Pages 182-184

  Kondo, Hiroyuki ^a   Tomie, Toshihisa ^b   Shimizu, Hideaki ^b  

^a NIKON CORPORATION   (Japan)

^b Electrochemical Lab   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042191281     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117365     Document Type: Article

References (11)

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2. H. Ade, J. Kirz, S. L. Hulbert, E. D. Johnson, E. Anderson, and D. Kern, Appl. Phys. Lett. 56. 1841 (1990).
3. C. Capasso, A. K. Ray-Chaudhuri, W. Ng, S. Liang, R. K. Cole, J. Wallace, F. Cerrina, G. Margaritondo, J. H. Underwood, J. B. Kortright, and R. C. C. Perera, J. Vac. Sci. Technol. A 9, 1248 (1991).
4. T. Tomie, UK Patent GB2268802 (1995).
5. P. Kruit and F. H. Read, J. Phys. E 16, 313 (1983).
6. H. Kondo and T. Tomie, J. Appl. Phys. 75, 3798 (1994).
7. The authors would like to thank T. Oshino of Nikon Corp. for providing Cr/C multilayer mirrors.
8. Technical data (TMCP1007J02, Hamamatsu Photonics Corp., 1995).
9. A paper reporting the result is now under preparation.
10. J. J. Yeh and I. Lindau, At. Data Nucl. Data Tables 32, 34 (1985).
11. S. Hüfner, Photoelectron Spectroscopy (Springer, Berlin, Heidelberg, 1995), p. 8.