-
1
-
-
36049020915
-
-
See, e.g, San. Jose SPIE, Bellingham, WA
-
See, e.g., SPIE Proceedings of Microlithography, San. Jose (SPIE, Bellingham, WA, 2007).
-
(2007)
SPIE Proceedings of Microlithography
-
-
-
2
-
-
0019051637
-
-
G. Schmahl, D. Rudolph, B. Niemann, and O. Christ, Q. Rev. Biophys. 13, 297 (1980).
-
(1980)
Q. Rev. Biophys
, vol.13
, pp. 297
-
-
Schmahl, G.1
Rudolph, D.2
Niemann, B.3
Christ, O.4
-
4
-
-
21744452342
-
-
W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, Nature (London) 435, 1210 (2005).
-
(2005)
Nature (London)
, vol.435
, pp. 1210
-
-
Chao, W.1
Harteneck, B.D.2
Liddle, J.A.3
Anderson, E.H.4
Attwood, D.T.5
-
5
-
-
0032655074
-
-
H. Fiedorowicz, A. Bartnik, M. Szczurek, H. Daido, N. Sakaya, V. Kmetik, Y. Kato, M. Suzuki, M. Matsumura, J. Tajima, T. Nakayama, and T. Wilhein, Opt. Commun. 163, 103 (1999).
-
(1999)
Opt. Commun
, vol.163
, pp. 103
-
-
Fiedorowicz, H.1
Bartnik, A.2
Szczurek, M.3
Daido, H.4
Sakaya, N.5
Kmetik, V.6
Kato, Y.7
Suzuki, M.8
Matsumura, M.9
Tajima, J.10
Nakayama, T.11
Wilhein, T.12
-
7
-
-
9744281219
-
-
C. Peth, S. Kranzusch, K. Mann, and W. Viöl, Rev. Sci. Instrum. 75, 3288 (2004).
-
(2004)
Rev. Sci. Instrum
, vol.75
, pp. 3288
-
-
Peth, C.1
Kranzusch, S.2
Mann, K.3
Viöl, W.4
-
8
-
-
0000671605
-
-
T. Ditmire, T. Donnelly, A. M. Rubenchik, R. W. Falcone, and M. D. Perry, Phys. Rev. A 53, 3379 (1996).
-
(1996)
Phys. Rev. A
, vol.53
, pp. 3379
-
-
Ditmire, T.1
Donnelly, T.2
Rubenchik, A.M.3
Falcone, R.W.4
Perry, M.D.5
-
9
-
-
3142599614
-
-
B. Abel, J. Aßmann, M. Faubel, K. Gäbel, S. Kranzusch, E. Lougovoj, K. Mann, T. Mißalla, and C. Peth,J. Appl. Phys. 95, 7619 (2004).
-
(2004)
J. Appl. Phys
, vol.95
, pp. 7619
-
-
Abel, B.1
Aßmann, J.2
Faubel, M.3
Gäbel, K.4
Kranzusch, S.5
Lougovoj, E.6
Mann, K.7
Mißalla, T.8
Peth, C.9
-
11
-
-
0034801892
-
-
M. Wieland, T. Wilhein, M. Faubel, Ch. Ellert, M. Schmidt, and O. Sublemontier, Appl. Phys. B: Lasers Opt. 72, 591 (2001).
-
(2001)
Appl. Phys. B: Lasers Opt
, vol.72
, pp. 591
-
-
Wieland, M.1
Wilhein, T.2
Faubel, M.3
Ellert, C.4
Schmidt, M.5
Sublemontier, O.6
-
15
-
-
5444239646
-
-
T. Higashiguchi, T. Hirata, M. Koga, C. Rajyagum, W. Sasaki, and S. Kubodera,Appl. Phys. B: Lasers Opt. 79, 587 (2004).
-
(2004)
Appl. Phys. B: Lasers Opt
, vol.79
, pp. 587
-
-
Higashiguchi, T.1
Hirata, T.2
Koga, M.3
Rajyagum, C.4
Sasaki, W.5
Kubodera, S.6
-
16
-
-
0005400498
-
-
R. Lebert, G. Schriever, T. Wilhein, and B. Niemann, J. Appl. Phys. 84, 3419 (1998).
-
(1998)
J. Appl. Phys
, vol.84
, pp. 3419
-
-
Lebert, R.1
Schriever, G.2
Wilhein, T.3
Niemann, B.4
-
17
-
-
0034109936
-
-
M. Berglund, L. Rymell, M. Peuker, T. Wilhein, and H. M. Hertz, J. Microsc. 197, 268 (2000).
-
(2000)
J. Microsc
, vol.197
, pp. 268
-
-
Berglund, M.1
Rymell, L.2
Peuker, M.3
Wilhein, T.4
Hertz, H.M.5
-
18
-
-
0001412925
-
-
E. Gullikson, J. Underwood, P. Batson, and V. Nikitin, J. X-Ray Sci. Technol. 3, 283 (1992).
-
(1992)
J. X-Ray Sci. Technol
, vol.3
, pp. 283
-
-
Gullikson, E.1
Underwood, J.2
Batson, P.3
Nikitin, V.4
-
19
-
-
10844242804
-
-
U. Vogt, T. Wilhein, H. Stiel, and H. Legall, Rev. Sci. Instrum. 75, 4606 (2004).
-
(2004)
Rev. Sci. Instrum
, vol.75
, pp. 4606
-
-
Vogt, U.1
Wilhein, T.2
Stiel, H.3
Legall, H.4
-
20
-
-
0030262920
-
-
H. U. Rahman, E. L. Ruden, K. D. Strohmaier, F. J. Wessel, and G. Yur, Rev. Sci. Instrum. 67, 3533 (1996).
-
(1996)
Rev. Sci. Instrum
, vol.67
, pp. 3533
-
-
Rahman, H.U.1
Ruden, E.L.2
Strohmaier, K.D.3
Wessel, F.J.4
Yur, G.5
-
24
-
-
34547378118
-
-
F. Barkusky, C. Peth, A. Bayer, and K. Mann, J. Appl. Phys. 101, 124908 (2007).
-
(2007)
J. Appl. Phys
, vol.101
, pp. 124908
-
-
Barkusky, F.1
Peth, C.2
Bayer, A.3
Mann, K.4
-
27
-
-
0347851938
-
-
Springer-Verlag, Berlin
-
J. H. Spurk, Strömungslehre (Springer-Verlag, Berlin, 1993).
-
(1993)
Strömungslehre
-
-
Spurk, J.H.1
|