Thick diamond layers angled by polishing to reveal defect and impurity depth profiles

Diamond and Related Materials

Volumn 17, Issue 4-5, 2008, Pages 506-510

  Tallaire, A ^a   Kasu, M ^a   Ueda, K ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

Defects; Diamond film; Impurities; Interface characterization

Indexed keywords

BORON COMPOUNDS; CATHODOLUMINESCENCE; IMPURITIES; MICROWAVES;

IMPURITY DEPTH PROFILES; INTERFACE CHARACTERIZATION; THICK DIAMOND LAYERS;

DIAMOND FILMS;

EID: 42949147099     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2007.12.042     Document Type: Article

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