Infrared studies of vacancy-oxygen-related complexes in electron-irradiated Czochralski-silicon

Rare Metals

Volumn 25, Issue 6 SUPPL. 2, 2006, Pages 55-58

  CAI, Lili ^a   CHEN, Hongjian ^a   LI, Yangxian ^a   CHEN, Guifeng ^a   LI, Xinghua ^a   HAO, Jiangang ^b   ZHANG, Yu ^b  

^a HEBEI UNIVERSITY OF TECHNOLOGY   (China)

^b TIANJIN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

electron irradiation; FTIR; irradiation defect; VO

Indexed keywords

COMPLEXATION; DEFECTS; ELECTRON IRRADIATION; FOURIER TRANSFORMS; OXYGEN;

ELECTRON-IRRADIATION; IRRADIATION DEFECT;

VACANCIES;

EID: 42949104991     PISSN: 10010521     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1001-0521(08)60052-2     Document Type: Article

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