Local structure and properties of oxide surfaces: Scanning probe analyses of ceramics

Journal of the American Ceramic Society

Volumn 81, Issue 12, 1998, Pages 3049-3070

  Bonnell, Dawn A ^{a,b,c,d,e,f,g,h,i,j}  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

^e MAX PLANCK INSTITUTE   (Germany)

^f IBM   (United States)

^g Basic Science Division   (United States)

^h AVS ^*  (United States)

ⁱ Pol Ind Azitain Edificio 3K Planta 2 I   (Spain)

^j Intl Union Vacuum Sci Technol A   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRIC FIELD EFFECTS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); OXIDES; PROBES; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY; SURFACE PROPERTIES; SURFACE STRUCTURE; THERMODYNAMIC STABILITY;

LOCAL ELECTROSTATIC FIELDS; SCANNING PROBE MICROSCOPY; SURFACE STABILIZATION;

SEMICONDUCTOR MATERIALS;

EID: 0032295034     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02739.x     Document Type: Article

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