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Volumn 13, Issue 10, 2007, Pages 561-566

Low-temperature PECVD of nanodevice-grade nc-3C-SiC

Author keywords

Deterministic nanofabrication; Nanocrystalline films; Nanodevice grade materials; Plasma nanotools; Silicon carbide

Indexed keywords

DESORPTION; FILMS; HYDROGEN; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PLASMAS; REFRACTIVE INDEX; SILICON; SILICON CARBIDE; STOICHIOMETRY;

EID: 42549118524     PISSN: 09481907     EISSN: 15213862     Source Type: Journal    
DOI: 10.1002/cvde.200706624     Document Type: Article
Times cited : (16)

References (35)
  • 6
    • 54949085667 scopus 로고    scopus 로고
    • http://www.ioffe.rssi.ru/SVA/NSM/Semicond/SiC/.
  • 14
    • 54949145636 scopus 로고    scopus 로고
    • Shinano Electric Refining Company ShinEtsu, Japan
    • Shinano Electric Refining Company (ShinEtsu, Japan), http://www.shinano- sic.co.jp.
  • 19
    • 54949103860 scopus 로고    scopus 로고
    • 2006 International Technology Roadmap for Semiconductors
    • 2006 International Technology Roadmap for Semiconductors, Field Effect Transistors, http://www.itrs.net
    • Field Effect Transistors
  • 35
    • 23044435393 scopus 로고    scopus 로고
    • S. Xu, J. D. Long, L. Sim, C. H. Diong, K. Ostrikov, Plasma Proc. Polym. 2005, 2, 373.
    • S. Xu, J. D. Long, L. Sim, C. H. Diong, K. Ostrikov, Plasma Proc. Polym. 2005, 2, 373.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.