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Volumn 17, Issue 12, 2005, Pages 1480-1483

Bottom-up fabrication of carbon-rich silicon carbide nanowires by manipulation of nanometer-sized ethanol menisci

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTROSTATICS; ETHANOL; FABRICATION; LITHOGRAPHY; MOLECULAR STRUCTURE; NANOTECHNOLOGY; OSCILLATIONS; SILICON; SILICON CARBIDE; SURFACE PROPERTIES; VAPORS;

EID: 20644447566     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200401466     Document Type: Article
Times cited : (59)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.