|
Volumn 41-42, Issue , 1998, Pages 25-30
|
Status and future of x-ray lithography
|
Author keywords
[No Author keywords available]
|
Indexed keywords
INTEGRATED CIRCUITS;
MASKS;
SEMICONDUCTOR DEVICE MANUFACTURE;
TECHNOLOGY;
130 NM GROUND RULES;
X RAY LITHOGRAPHY;
|
EID: 4243891784
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(98)00007-0 Document Type: Article |
Times cited : (15)
|
References (30)
|