THz emission Microscopy with sub-wavelength broadband source

Optics Express

Volumn 16, Issue 7, 2008, Pages 4731-4738

  Lecaque, Romain ^a   Grésillon, Samuel ^a   Boceara, Claude ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DECONVOLUTION; DIFFRACTION; EMISSION SPECTROSCOPY; IMAGE RESOLUTION; SCATTERING; WAVELENGTH;

BROADBAND SOURCE; MIE SCATTERING DIFFRACTION MODEL; NEAR FIELD MICROSCOPE; THZ EMISSION MICROSCOPY;

MICROSCOPES;

DIAGNOSTIC AGENT;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; ILLUMINATION; INFRARED RADIATION; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; MICROWAVE RADIATION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; LIGHTING; MICROSCOPY; MICROWAVES;

EID: 41649108825     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.004731     Document Type: Article

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