Transient optical elements: Application to near-field microscopy

Journal of Microscopy

Volumn 210, Issue 3, 2003, Pages 307-310

  Simanovskii, D ^a   Palanker, D ^a   Cohn, K ^a   Smith, T ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Fresnel lens; Near field microscopy; Transient optical element

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; OPTICAL INSTRUMENT LENSES; PROBES;

FRESNEL LENS; NEAR FIELD IMAGING; NEAR FIELD INFRARED MICROSCOPIES; NEAR FIELD MICROSCOPY; OPTICALLY INDUCED; PHOTO-INDUCED; SMALL APERTURE; SOLID IMMERSION MICROSCOPY; TRANSIENT MIRROR; TRANSIENT OPTICAL ELEMENT;

REFRACTIVE INDEX;

ARTICLE; IMAGE QUALITY; LENS; LIGHT; MICROSCOPY; MOLECULAR PROBE; OPTICS; PRIORITY JOURNAL; REFRACTION INDEX; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR;

EID: 0037663774     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01156.x     Document Type: Article

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