Nanometer scale apertureless near field microscopy

Applied Surface Science

Volumn 164, Issue 1-4, 2000, Pages 118-123

  Gresillon S ^a   Ducourtieux, S ^a   Lahrech, A ^a   Aigouy, L ^a   Rivoal, J C ^a   Boccara, A C ^a  

^a INSTITUT LANGEVIN   (France)

Author keywords

Field enhancement; Local properties; Near field

Indexed keywords

EID: 0342409362     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00350-0     Document Type: Article

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