Room temperature ferromagnetism in 200 KeV Nickel ion implanted Zinc oxide film

Radiation Effects and Defects in Solids

Volumn 163, Issue 3, 2008, Pages 215-222

  Ghosh, S ^a   Kanjilal, D ^b   Pandey, B ^a   Saurav, M ^a   Kumar, P ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

AFM; AGM; Ferromagnetism; Four probe resistivity; GAXRD; Implantation; XRF

Indexed keywords

FERROMAGNETISM; ION IMPLANTATION; MAGNETOMETERS; NICKEL; PHASE TRANSITIONS; X RAY DIFFRACTION; ZINC OXIDE;

GRAZING ANGLE X-RAY DIFFRACTION; IMPLANTATION; ROOM TEMPERATURE; VAPOR PHASE TRANSPORT;

OXIDE FILMS;

EID: 41549123587     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150701450946     Document Type: Article

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