FADES: A fault emulation tool for fast dependability assessment

Proceedings - 2006 IEEE International Conference on Field Programmable Technology, FPT 2006

Volumn , Issue , 2006, Pages 221-228

  De Andrés, David ^a   Ruiz, Juan Carlos ^a   Gil, Daniel ^a   Gil, Pedro ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); MATHEMATICAL MODELS; USER INTERFACES;

DEPENDABILITY; FAST DEPENDABILITY ASSESSMENT; FAULT INJECTION; FAULT MODELS;

VLSI CIRCUITS;

EID: 41549100247     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPT.2006.270315     Document Type: Conference Paper

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