Fast emulation of permanent faults in VLSI systems

Proceedings - 2006 International Conference on Field Programmable Logic and Applications, FPL

Volumn , Issue , 2006, Pages 247-252

  De Andrés, David ^a   Ruiz, Juan Carlos ^a   Gil, Daniel ^a   Gil, Pedro ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FAULT LOCATION; EXPERIMENTS; FUZZY LOGIC; INJECTION (OIL WELLS); RANDOM ACCESS STORAGE;

AUTOMATED TOOLS; DEEP SUB-MICRON (DSM); FAULT INJECTION TECHNIQUES; FAULT MODELING; FIELD PROGRAMMABLE GATE ARRAY (FPGA); FIELD PROGRAMMABLE LOGIC (FPL); INTERNATIONAL CONFERENCES; MODEL BASED (OPC); PERMANENT FAULTS; SHORT CIRCUIT (SC); STUCK-AT FAULT (SAF) MODEL; TIME SAVINGS; VLSI SYSTEMS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 41549099336     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPL.2006.311221     Document Type: Conference Paper

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