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Volumn 57, Issue 1, 2008, Pages 2-13

An application of the EM algorithm to degradation modeling

Author keywords

Change points; Degradation modeling; EM algorithm; Maximum likelihood estimation

Indexed keywords

ALGORITHMS; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; RANDOM PROCESSES;

EID: 41449091560     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2008.916867     Document Type: Article
Times cited : (67)

References (40)
  • 2
    • 0003986655 scopus 로고
    • 2nd ed. New York: Van Nostrand Reinhold
    • G. P. Agrawal and N. K. Dutta, Semiconductor Lasers, 2nd ed. New York: Van Nostrand Reinhold, 1993, pp. 583-606.
    • (1993) Semiconductor Lasers , pp. 583-606
    • Agrawal, G.P.1    Dutta, N.K.2
  • 3
    • 0016561192 scopus 로고
    • Rapid degradation in double-heterostructure lasers-Proposal of a new model for the directional growth of dislocation networks
    • J. Matsui, R. Ishida, and Y. Nannichi, "Rapid degradation in double-heterostructure lasers-Proposal of a new model for the directional growth of dislocation networks," Japanese Journal of Applied Physics, vol. 14, pp. 1561-1568, 1975.
    • (1975) Japanese Journal of Applied Physics , vol.14 , pp. 1561-1568
    • Matsui, J.1    Ishida, R.2    Nannichi, Y.3
  • 4
    • 0001057243 scopus 로고
    • Long-term mechanical behavior of optical fibers coated with a UV-curable epoxy acrylate
    • T. T. Wang and H. M. Zupko, "Long-term mechanical behavior of optical fibers coated with a UV-curable epoxy acrylate," Journal of Material Sciences, vol. 13, pp. 2241-2248, 1978.
    • (1978) Journal of Material Sciences , vol.13 , pp. 2241-2248
    • Wang, T.T.1    Zupko, H.M.2
  • 6
  • 7
    • 33645542340 scopus 로고    scopus 로고
    • A change-point analysis for modeling incomplete burn-in for light displays
    • S. J. Bae and P. H. Kvam, "A change-point analysis for modeling incomplete burn-in for light displays," IIE Trans., vol. 38, pp. 489-498, 2006.
    • (2006) IIE Trans , vol.38 , pp. 489-498
    • Bae, S.J.1    Kvam, P.H.2
  • 8
    • 0029386321 scopus 로고
    • Using degradation data to improve fluorescent lamp reliability
    • S. T. Tseng, M. S. Hamada, and C. H. Chiao, "Using degradation data to improve fluorescent lamp reliability," Journal of Quality Technology vol. 27, pp. 363-369, 1995.
    • (1995) Journal of Quality Technology , vol.27 , pp. 363-369
    • Tseng, S.T.1    Hamada, M.S.2    Chiao, C.H.3
  • 9
    • 0030109470 scopus 로고    scopus 로고
    • Using degradation data from an experiment to achieve robust reliability for light-emitting diodes
    • C. H. Chiao and M. S. Hamada, "Using degradation data from an experiment to achieve robust reliability for light-emitting diodes," Quality and Reliability Engineering International, vol. 12, pp. 89-94, 1996.
    • (1996) Quality and Reliability Engineering International , vol.12 , pp. 89-94
    • Chiao, C.H.1    Hamada, M.S.2
  • 10
    • 0022037522 scopus 로고
    • 1.3-pn laser reliability determination for submarine cable systems
    • B. W. Hakki, P. E. Fraley, and T. F. Eltringham, "1.3-pn laser reliability determination for submarine cable systems," AT&T Technology Journal, vol. 64, pp. 771-807, 1985.
    • (1985) AT&T Technology Journal , vol.64 , pp. 771-807
    • Hakki, B.W.1    Fraley, P.E.2    Eltringham, T.F.3
  • 11
    • 8344270193 scopus 로고    scopus 로고
    • A nonlinear random coefficients model for degradation testing
    • S. J. Bae and P. H. Kvam, "A nonlinear random coefficients model for degradation testing," Technometrics, vol. 46, pp. 460-469, 2004.
    • (2004) Technometrics , vol.46 , pp. 460-469
    • Bae, S.J.1    Kvam, P.H.2
  • 12
    • 0019583484 scopus 로고
    • Analysis of performance degradation data from accelerated tests
    • W. Nelson, "Analysis of performance degradation data from accelerated tests," IEEE Trans. Reliability, vol. 30, pp. 149-155, 1981.
    • (1981) IEEE Trans. Reliability , vol.30 , pp. 149-155
    • Nelson, W.1
  • 13
    • 0027595086 scopus 로고
    • Using degradation measures to estimate a time-to-failure distribution
    • C. J. Lu and W. Q. Meeker, "Using degradation measures to estimate a time-to-failure distribution," Technometrics, vol. 35, pp. 161-173, 1993.
    • (1993) Technometrics , vol.35 , pp. 161-173
    • Lu, C.J.1    Meeker, W.Q.2
  • 14
    • 0032071686 scopus 로고    scopus 로고
    • Accelerated degradation tests: Modeling and analysis
    • W. Q. Meeker, L. A. Escobar, and C. J. Lu, "Accelerated degradation tests: Modeling and analysis," Technometrics, vol. 40, pp. 89-99, 1998.
    • (1998) Technometrics , vol.40 , pp. 89-99
    • Meeker, W.Q.1    Escobar, L.A.2    Lu, C.J.3
  • 15
    • 0031276315 scopus 로고    scopus 로고
    • Statistical inference of a time-to-failure distribution derived from linear degradation data
    • J. C. Lu, J. Park, and Q. Yang, "Statistical inference of a time-to-failure distribution derived from linear degradation data," Technometrics, vol. 9, pp. 391-400, 1997.
    • (1997) Technometrics , vol.9 , pp. 391-400
    • Lu, J.C.1    Park, J.2    Yang, Q.3
  • 16
    • 0026384828 scopus 로고
    • Reliability assessment based on accelerated degradation: A case study
    • M. B. Carey and R. H. Koenig, "Reliability assessment based on accelerated degradation: A case study," IEEE Trans. Reliability, vol. 40, pp. 499-506, 1991.
    • (1991) IEEE Trans. Reliability , vol.40 , pp. 499-506
    • Carey, M.B.1    Koenig, R.H.2
  • 17
    • 0029518929 scopus 로고
    • Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
    • L. C. Tang and D. S. Chang, "Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies," IEEE Trans. Reliability, vol. 44, pp. 562-566, 1995.
    • (1995) IEEE Trans. Reliability , vol.44 , pp. 562-566
    • Tang, L.C.1    Chang, D.S.2
  • 18
    • 0030626145 scopus 로고    scopus 로고
    • Modeling accelerated degradation data using wiener diffusion with a time scale transformation
    • G. A. Whitmore and F. Schenkelberg, "Modeling accelerated degradation data using wiener diffusion with a time scale transformation," Lifetime Data Analysis, vol. 3, pp. 27-45, 1997.
    • (1997) Lifetime Data Analysis , vol.3 , pp. 27-45
    • Whitmore, G.A.1    Schenkelberg, F.2
  • 19
    • 3042808870 scopus 로고    scopus 로고
    • Inference from accelerated degradation and failure data based on Gaussian process models
    • W. J. Padgett and M. A. Tominson, "Inference from accelerated degradation and failure data based on Gaussian process models," Lifetime Data Analysis, vol. 10, pp. 191-206, 2004.
    • (2004) Lifetime Data Analysis , vol.10 , pp. 191-206
    • Padgett, W.J.1    Tominson, M.A.2
  • 21
    • 4444275801 scopus 로고    scopus 로고
    • Reliability prediction and testing plan based on an accelerated degradation rate model
    • H. T. Liao and E. A. Elsayed, "Reliability prediction and testing plan based on an accelerated degradation rate model," International Journal of Materials and Product Technology, vol. 21, pp. 402-422, 2004.
    • (2004) International Journal of Materials and Product Technology , vol.21 , pp. 402-422
    • Liao, H.T.1    Elsayed, E.A.2
  • 23
    • 0035291219 scopus 로고    scopus 로고
    • Estimation in degradation models with explanatory variables
    • V. Bagdonavicius and M. S. Nikulin, "Estimation in degradation models with explanatory variables," Lifetime Data Analysis, vol. 7, pp. 85-103, 2000.
    • (2000) Lifetime Data Analysis , vol.7 , pp. 85-103
    • Bagdonavicius, V.1    Nikulin, M.S.2
  • 24
    • 19044395347 scopus 로고    scopus 로고
    • Life distributions from component degradation signals: A Bayesian approach
    • N. Gebraeel, M. Lawley, R. Li, and J. K. Ryan, "Life distributions from component degradation signals: A Bayesian approach," IIE Trans., vol. 37, pp. 543-557, 2005.
    • (2005) IIE Trans , vol.37 , pp. 543-557
    • Gebraeel, N.1    Lawley, M.2    Li, R.3    Ryan, J.K.4
  • 25
    • 0000111916 scopus 로고
    • Estimation in change-point hazard rate models
    • H. T. Nguyen, G. S. Rogers, and E. A. Walker, "Estimation in change-point hazard rate models," Biometrika, vol. 71, pp. 299-304, 1984.
    • (1984) Biometrika , vol.71 , pp. 299-304
    • Nguyen, H.T.1    Rogers, G.S.2    Walker, E.A.3
  • 26
    • 70350340432 scopus 로고
    • Maximum likelihood estimation in hazard rate models with a change-point
    • Y. C. Yao, "Maximum likelihood estimation in hazard rate models with a change-point," Communications in Statistics-Theory and Methods, vol. 14, pp. 2455-2466, 1986.
    • (1986) Communications in Statistics-Theory and Methods , vol.14 , pp. 2455-2466
    • Yao, Y.C.1
  • 27
    • 84973041629 scopus 로고
    • Strong consistency of the maximum likelihood estimators in the change-point hazard rate model
    • T. D. Pham and H. T. Nguyen, "Strong consistency of the maximum likelihood estimators in the change-point hazard rate model," Statistics, vol. 21, pp. 203-216, 1990.
    • (1990) Statistics , vol.21 , pp. 203-216
    • Pham, T.D.1    Nguyen, H.T.2
  • 30
    • 0041703839 scopus 로고    scopus 로고
    • A change-point perspective on the software failure process
    • F. Z. Zou, "A change-point perspective on the software failure process," Software Testing Verification Reliability, vol. 13, pp. 85-93, 2003.
    • (2003) Software Testing Verification Reliability , vol.13 , pp. 85-93
    • Zou, F.Z.1
  • 31
    • 17044417262 scopus 로고    scopus 로고
    • Parameter estimation of some NHPP software reliability models with change-point
    • Z. Wang and J. Wang, "Parameter estimation of some NHPP software reliability models with change-point," Communications in Statistics-Simulation and Computation, vol. 34, pp. 121-134, 2005.
    • (2005) Communications in Statistics-Simulation and Computation , vol.34 , pp. 121-134
    • Wang, Z.1    Wang, J.2
  • 32
    • 0002629270 scopus 로고
    • Maximum likelihood estimation from incomplete data via the EM algorithm (with discussion)
    • A. P. Dempster, N. M. Laird, and D. B. Rubin, "Maximum likelihood estimation from incomplete data via the EM algorithm (with discussion)," Journal of the Royal Statistical Society B, vol. 39, pp. 1-38, 1977.
    • (1977) Journal of the Royal Statistical Society B , vol.39 , pp. 1-38
    • Dempster, A.P.1    Laird, N.M.2    Rubin, D.B.3
  • 36
    • 0001044972 scopus 로고
    • Finding the observed information matrix when using the EM algorithm
    • T. A. Louis, "Finding the observed information matrix when using the EM algorithm," Journal of the Royal Statistical Society Series B, vol 44, pp. 226-233, 1982.
    • (1982) Journal of the Royal Statistical Society Series B , vol.44 , pp. 226-233
    • Louis, T.A.1
  • 38
    • 0026818056 scopus 로고
    • Models for variable stress accelerated life testing experiments based on wiener process and the inverse Gaussian distribution
    • K. Doksum and A. Hoyland, "Models for variable stress accelerated life testing experiments based on wiener process and the inverse Gaussian distribution," Technometrics, vol. 34, pp. 74-82, 1992.
    • (1992) Technometrics , vol.34 , pp. 74-82
    • Doksum, K.1    Hoyland, A.2
  • 40
    • 84929987713 scopus 로고
    • Probabilistic Models of Cumulative Damage
    • J. L. Bogdanoff and F. Kozin, Probabilistic Models of Cumulative Damage. New York: Wiley, 1985, pp. 66-67.
    • (1985) New York: Wiley , pp. 66-67
    • Bogdanoff, J.L.1    Kozin, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.