-
1
-
-
0028481886
-
Experimental design for a class of accelerated degradation tests
-
Boulanger, M. and Escobar, L.A. (1994) 'Experimental design for a class of accelerated degradation tests', Technometrics, Vol. 36, pp.260-272.
-
(1994)
Technometrics
, vol.36
, pp. 260-272
-
-
Boulanger, M.1
Escobar, L.A.2
-
7
-
-
0027595086
-
Using degradation measures to estimate a time-to-failure distribution
-
Lu, J.C. and Meeker, W.Q. (1993) 'Using degradation measures to estimate a time-to-failure distribution', Technometrics, Vol. 35, pp.161-174.
-
(1993)
Technometrics
, vol.35
, pp. 161-174
-
-
Lu, J.C.1
Meeker, W.Q.2
-
8
-
-
0003311918
-
How to plan an accelerated life test-some practical guidelines
-
ASQC Basic reference in QC
-
Meeker, W.Q. and Hahn, G.J. (1985) 'How to plan an accelerated life test-some practical guidelines', Statistical Techniques, Vol. 10, ASQC Basic reference in QC.
-
(1985)
Statistical Techniques
, vol.10
-
-
Meeker, W.Q.1
Hahn, G.J.2
-
9
-
-
0032071686
-
Accelerated degradation tests: Modeling and analysis
-
Meeker, W.Q., Escobar, L.A. and Lu, J.C. (1998) 'Accelerated degradation tests: modeling and analysis', Technometrics, Vol. 40, pp.89-99.
-
(1998)
Technometrics
, vol.40
, pp. 89-99
-
-
Meeker, W.Q.1
Escobar, L.A.2
Lu, J.C.3
-
11
-
-
0000238336
-
A simplex method for function minimization
-
Nelder, J.A. and Mead, R. (1965) 'A simplex method for function minimization', Computer Journal, Vol. 7, pp.308-313.
-
(1965)
Computer Journal
, vol.7
, pp. 308-313
-
-
Nelder, J.A.1
Mead, R.2
-
13
-
-
0031355018
-
Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition
-
Park, J.I. and Yum, B.J. (1997) 'Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition', Engineering Optimization, Vol. 28, pp. 199-230.
-
(1997)
Engineering Optimization
, vol.28
, pp. 199-230
-
-
Park, J.I.1
Yum, B.J.2
-
14
-
-
0018470138
-
Temperature and current dependency of degradation in red-emitting Gap LED's
-
Ralston, J.M. and Mann, J.W. (1979) Temperature and current dependency of degradation in red-emitting Gap LED's', Journal of Applied Physics, Vol. 50, pp.3630-3637.
-
(1979)
Journal of Applied Physics
, vol.50
, pp. 3630-3637
-
-
Ralston, J.M.1
Mann, J.W.2
-
15
-
-
0032664111
-
Analysing accelerated degradation data by nonparametric regression
-
Shiau, J.J.H. and Lin, H.H. (1999) 'Analysing accelerated degradation data by nonparametric regression', IEEE Transaction on Reliability, Vol. 48, pp.149-158.
-
(1999)
IEEE Transaction on Reliability
, vol.48
, pp. 149-158
-
-
Shiau, J.J.H.1
Lin, H.H.2
-
16
-
-
0036891325
-
Accelerated degradation-tests with tightened critical values
-
Yang, G. and Yang, K. (2002) 'Accelerated degradation-tests with tightened critical values', IEEE Transactions on Reliability, Vol. 51, pp.463-468.
-
(2002)
IEEE Transactions on Reliability
, vol.51
, pp. 463-468
-
-
Yang, G.1
Yang, K.2
-
18
-
-
0032676359
-
Approaches for reliability modeling of continuous-state devices
-
Zuo, M.J., Jiang, R.Y. and Yam, R.C.M. (1999) 'Approaches for reliability modeling of continuous-state devices', IEEE Transactions on Reliability, Vol. 48, pp.9-18.
-
(1999)
IEEE Transactions on Reliability
, vol.48
, pp. 9-18
-
-
Zuo, M.J.1
Jiang, R.Y.2
Yam, R.C.M.3
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