Robust reliability for light emitting diodes using degradation measurements

Quality and Reliability Engineering International

Volumn 12, Issue 2, 1996, Pages 89-94

  Chiao, Chih Hua ^a,c,d   Hamada, Michael ^b,e  

^a SOOCHOW UNIVERSITY   (Taiwan)

^b TELCORDIA TECHNOLOGIES   (United States)

^c Soochow University

^d NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^e UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Control and noise factors; Loss function; Product array; Signal to noise ratios; Taguchi's robust design

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; DESIGN; LIGHT EMITTING DIODES; MANUFACTURE; OPTICAL PROPERTIES; OPTIMIZATION; SIGNAL TO NOISE RATIO;

DEGRADATION MEASUREMENTS; LOSS FUNCTION; NOISE FACTOR; PRODUCT ARRAY; TAGUCHI ROBUST DESIGN;

RELIABILITY;

EID: 0030109470     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199603)12:2<89::AID-QRE997>3.0.CO;2-D     Document Type: Article

References (6)

1. L. W. Condra, Reliability Improvement with Design of Experiments, Marcel Dekker, New York, NY, 1993.
2. M. Hamada, 'Analysis of experiments for reliability improvement and robust reliability', in N. Balakrishnan, (ed.), Recent Advances in Life-Testing and Reliability, CRC Press, Boca Raton, FL, 1995.
3. W. Nelson, Accelerated Testing-Statistical Models, Test Plans, and Data Analysis, Wiley, New York, NY, 1990.
4. C. J. Lu and W. Q. Meeker, 'Using degradation measures to estimate a time-to-failure distribution', Technometrics, 35, 161-174 (1993).
5. W. Welch, T. K. Yu, S. M. Kang and J. Sacks, 'Computer experiments for quality control by parameter design', Journal of Quality Technology, 22, 15-22 (1990).
6. D. C. Montgomery, Design and Analysis of Experiments, 3rd edn, Wiley, New York, NY, 1991.