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Volumn 44, Issue 7 B, 2005, Pages 5425-5429

Nanorheological analysis of polymer surfaces by atomic force microscopy

Author keywords

AFM; Elastic modulus; Force volume; Force distance curve; Nanorheology; Polymer blend

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; INFORMATION RETRIEVAL; RHEOLOGY;

EID: 28844434248     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.5425     Document Type: Article
Times cited : (42)

References (14)
  • 11
    • 31844452422 scopus 로고    scopus 로고
    • note
    • Because modes of operation are different, obtained topographic images may not resemble to each other if the sample deformation caused by frictional or adhesive interraction becomes dominant.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.