Sensor referenced real-time videolization of atomic force microscopy for nanomanipulations

IEEE/ASME Transactions on Mechatronics

Volumn 13, Issue 1, 2008, Pages 76-85

  Liu, Lianqing ^a,b,c   Luo, Yilun ^b   Xi, Nig ^b   Wang, Yuechao ^a,b,c   Zhang, Jiangbo ^b   Li, Guangyong ^d  

^a SHENYANG INSTITUTE OF AUTOMATION   (China)

^b Michigan State University   (United States)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^d University of Pittsburgh   (United States)

Author keywords

Atomic force microscopy (AFM); Fault detection; Local scan; Nanomanipulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; FAULT DETECTION; KALMAN FILTERS; REAL TIME SYSTEMS; SENSORS; VIDEO RECORDING; VIRTUAL REALITY;

NANOMANIPULATION; REAL-TIME VISUAL FEEDBACK; VIDEOLIZATION;

MANIPULATORS;

EID: 41249095894     PISSN: 10834435     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMECH.2008.917859     Document Type: Article

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