Block phase correlation-based automatic drift compensation for atomic force microscopes

2005 5th IEEE Conference on Nanotechnology

Volumn 1, Issue , 2005, Pages 370-373

  Yang, Q ^a   Jagannathan, S ^a   Bohannan, E W ^b  

^a Architectural and Environmental Engineering   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

Atomic Force microscope; Drift; Nanomanipulation; Neural Network; Phase Correlation Method

Indexed keywords

ERROR ANALYSIS; NANOSTRUCTURED MATERIALS; NEURAL NETWORKS; PHASE MODULATION; THERMAL EFFECTS;

COMPENSATION; DRIFT; NANOMANIPULATION; PHASE-CORRELATION METHOD;

ATOMIC FORCE MICROSCOPY;

EID: 33747015832     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2005.1500773     Document Type: Conference Paper

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