|
Volumn 33, Issue 5, 2008, Pages 455-457
|
Metrologies for the phase characterization of attosecond extreme ultraviolet optics
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATTOSECOND SCIENCE;
EXTREME ULTRAVIOLET (EUV) OPTICS;
MULTILAYER OPTIC;
PHOTON ENERGIES;
IMPULSE RESPONSE;
LIGHT REFLECTION;
MIRRORS;
MULTILAYERS;
PHASE SHIFT;
ULTRASHORT PULSES;
ULTRAVIOLET RADIATION;
|
EID: 41149096449
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.33.000455 Document Type: Article |
Times cited : (39)
|
References (13)
|