Formulae of Total Electron Yield for Multilayers: Extension of Pepper's Method

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 10, 2003, Pages 6459-6466

  Ejima, Takeo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Angular dependence; Attenuation length; Interface; Multilayer; Photoelectric yield; Photoelectron; Potential barrier; TEY; Total electron yield; Transmission rate; Transmissivity; Yield

Indexed keywords

ELECTROMAGNETIC WAVE ATTENUATION; ELECTRONS; LITHIUM COMPOUNDS; PHOTOELECTRICITY; QUANTUM THEORY; SILICON; SUBSTRATES; SURFACE PROPERTIES; VACUUM APPLICATIONS;

TOTAL ELECTRON YIELDS (TEY);

MULTILAYERS;

EID: 0348156953     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6459     Document Type: Article

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