In-plane structure and polymorphism of pentacene thin films

Materials Research Society Symposium Proceedings

Volumn 965, Issue , 2006, Pages 115-120

  Kakudate, Toshiyuki ^a   Yoshimoto, Noriyuki ^a   Saito, Yoshio ^b  

^a IWATE UNIVERSITY   (Japan)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC HYDROCARBONS; LATTICE CONSTANTS; MONOLAYERS; POLYMORPHISM; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CLASSICAL NUCLEATION THEORY; GRAZING INCIDENCE X-RAY DIFFRACTOMETRY; PENTACENE THIN FILMS;

THIN FILMS;

EID: 40949093987     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0965-s12-52     Document Type: Conference Paper

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