First observation of in-plane X-ray diffraction arising from a single layered inorganic compound film by a grazing incidence X-ray diffraction system with a conventional laboratory X-ray source

Chemical Physics Letters

Volumn 352, Issue 3-4, 2002, Pages 213-219

  Takahashi, Shin ^a   Taniguchi, Masahiro ^b   Omote, Kazuhiko ^c   Wakabayashi, Noboru ^a   Tanaka, Rina ^a   Yamagishi, Akihiko ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

^c RIGAKU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037196502     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(01)01446-4     Document Type: Article

References (21)

1. Crystal Structures of Clay Minerals and Their X-ray Identification