Nano-tribological characteristics of lanthanum-based thin films on sulfonated self-assembled monolayer of 3-mercaptopropyl trimethoxysilane

Journal of Rare Earths

Volumn 26, Issue 1, 2008, Pages 93-98

  BAI, Tao ^a   CHENG, Xianhua ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

atomic force microscope; nano tribological characteristics; rare earths; self assembled monolayer; X ray photoelectron spectrometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; LANTHANUM COMPOUNDS; SELF ASSEMBLED MONOLAYERS; SULFONATION; X RAY PHOTOELECTRON SPECTROSCOPY;

NANO-TRIBOLOGICAL CHARACTERISTICS; NORMAL LOADS; SILICON SUBSTRATES;

THIN FILMS;

EID: 40749135844     PISSN: 10020721     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1002-0721(08)60045-9     Document Type: Article

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