Determination of electronic properties of Al/p-Si/composite organic semiconductor (MIOS) junction barrier by current-voltage and capacitance-voltage methods

Synthetic Metals

Volumn 158, Issue 3-4, 2008, Pages 108-112

  Yakuphanoglu, Fahrettin ^a  

^a FIRAT UNIVERSITY   (Turkey)

Author keywords

Interfacial state density; Metal semiconductor contact; Organic semiconductor

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; VOLTAGE CONTROL;

INTERFACIAL STATE DENSITY; METAL-SEMICONDUCTOR CONTACT; SERIES RESISTANCE;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 40649092776     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2007.12.006     Document Type: Article

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