Raman spectroscopy and X-ray diffraction studies of stress effects in PbTiO3 thin films

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 54, Issue 12, 2007, Pages 2623-2630

  Bartasyte, Ausrine ^a,b   Chaix Pluchery, Odette ^a   Kreisel, Jens ^a   Santiso, José ^c   Margueron, Samuel ^a   Boudard, Michel ^d   Jiménez, Carmen ^a   Abrutis, Adulfas ^b   Weiss, François ^a  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b VILNIUS UNIVERSITY   (Lithuania)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL FILMS; LEAD; RAMAN SPECTROSCOPY; X RAY DIFFRACTION;

DOMAIN STRUCTURE; RESIDUAL STRESS EVOLUTION; TENSILE RESIDUAL STRESS;

RESIDUAL STRESSES;

LEAD; LEAD TITANATE; TITANIUM; UNCLASSIFIED DRUG;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; ELASTICITY; MATERIALS TESTING; MECHANICAL STRESS; RAMAN SPECTROMETRY; X RAY DIFFRACTION;

COMPUTER SIMULATION; ELASTICITY; LEAD; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; SPECTRUM ANALYSIS, RAMAN; STRESS, MECHANICAL; TITANIUM; X-RAY DIFFRACTION;

EID: 40649083032     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2007.589     Document Type: Conference Paper

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