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Volumn 92, Issue 9, 2008, Pages

Highly sensitive detection of near-field Raman scattered light from strained SiSiGe heterostructures by scanning near-field optical Raman microscope using ultraviolet resonant Raman scattering

(3) Yoshikawa, M a Murakami, M a Ishida, H a

a TORAY RESEARCH CENTER INC (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

DECAY CURVE; PYRAMIDAL PROBES; RAMAN INTENSITY;

RAMAN SCATTERING;

EID: 40549101029 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2870201 Document Type: Article

Times cited : (8)

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