Crosshatching on a SiGe film grown on a Si(001) substrate studied by Raman mapping and atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 23, 2002, Pages 2333031-2333034

  Chen, H ^a   Li, Y K ^a   Peng, C S ^a   Liu, H F ^a   Liu, Y L ^a   Huang, Q ^a   Zhou, J M ^a   Xue, Qi Kun ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; FILM; MOLECULAR DYNAMICS; MOLECULAR MODEL; RAMAN SPECTROMETRY; SEMICONDUCTOR;

EID: 0037096488     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (26)