Defects in dilute nitrides

Journal of Physics Condensed Matter

Volumn 16, Issue 31, 2004, Pages

  Buyanova, I A ^a   Chen, W M ^a   Tu, C W ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON TRAPS; ELECTRONIC PROPERTIES; FIBER LASERS; GALLIUM ALLOYS; HIGH TEMPERATURE EFFECTS; LATTICE CONSTANTS; MAGNETIC RESONANCE; MICROSCOPIC EXAMINATION; OPTICAL FIBERS; OPTOELECTRONIC DEVICES; POSITRON ANNIHILATION SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING GALLIUM; SOLAR CELLS;

DILUTE NITRIDES; MICROSCOPIC STRUCTURES; OPTICALLY DETECTED MAGNETIC RESONANCE (ODMR); STRUCTURE ENGINEERING;

NITRIDES;

EID: 4043154806     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/31/003     Document Type: Review

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