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Volumn 90, Issue 7, 2001, Pages 3405-3408

Deep levels and their impact on generation current in Sn-doped InGaAsN

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Indexed keywords

EID: 0035476354 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1396832 Document Type: Article

Times cited : (45)

References (12)

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