Diffraction line broadening analysis if broadening is caused by both dislocations and limited crystallite size

Journal of Research of the National Institute of Standards and Technology

Volumn 109, Issue 1, 2004, Pages 65-74

  Kamminga, J D ^a   Seijbel, L J ^b  

^a NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

^b Broker Nonius BV   (Netherlands)

Author keywords

Crystallite size; Diffraction line broadening; Dislocations; Nickel; Recrystallization; X ray diffraction

Indexed keywords

ANNEALING; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; MICROSTRUCTURE; NICKEL; RECRYSTALLIZATION (METALLURGY);

CRYSTALLITE SIZE; DIFFRACTION LINE BROADENING; STRAIN BROADENING;

X RAY DIFFRACTION;

EID: 4043122517     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.109.005     Document Type: Conference Paper

References (17)

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