Measurement of dislocation distributions by means of X-ray diffraction

Materials Science and Engineering: A

Volumn 309-310, Issue , 2001, Pages 55-59

  Kamminga, J D ^a   Delhez, R ^b  

^a NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Aluminium; Diffraction line broadening; Dislocations; Stress relaxation; Thin layers

Indexed keywords

ALUMINUM; ANNEALING; COOLING; SILICON; TENSILE STRESS; X RAY DIFFRACTION;

DISLOCATION DISTRIBUTIONS;

DISLOCATIONS (CRYSTALS);

PLASTIC DEFORMATION;

EID: 0035879856     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01665-8     Document Type: Article

References (7)

1. Fundamental aspects of disclation theory