Influence of process parameters on the morphology of Au/SiO2 nanocomposites synthesized by radio-frequency sputtering

Journal of Applied Physics

Volumn 96, Issue 3, 2004, Pages 1655-1665

  Barreca, Davide ^a   Gasparotto, Alberto ^a   Tondello, Eugenio ^a   Bruno, Giovanni ^b   Losurdo, Maria ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; INTERFEROMETRY; MORPHOLOGY; PARAMETER ESTIMATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICA; SPUTTERING; SURFACE PLASMON RESONANCE; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTERLIKE SYSTEMS; ISLANDLIKE SYSTEMS; LASER REFLECTION INTERFEROMETRY (LRI); NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

EID: 4043087880     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1766083     Document Type: Article

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