Secondary emission of MCsn+ molecular ions under the joint influence of electropositive and electronegative elements

Surface Science

Volumn 602, Issue 5, 2008, Pages 1061-1065

  Saha, Biswajit ^a   Sarkar, Subhendu ^a   Chakraborty, Purushottam ^a   Gnaser, Hubert ^b  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

^b Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

Author keywords

Cesium; MCsn+ molecular ion emission; Secondary ion mass spectrometry; Silver; Sputtering; Work function measurement

Indexed keywords

ELECTRONEGATIVITY; KINETIC ENERGY; SECONDARY ION MASS SPECTROMETRY; SILVER; SPUTTERING; WORK FUNCTION;

ION EMISSION; MOLECULAR ION EMISSION; OXYGEN PRESSURES; WORK FUNCTION MEASUREMENT;

IONS;

EID: 39749129049     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.01.001     Document Type: Article

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