Secondary ion emission from Ti, V, Cu, Ag and Au surfaces under KeV Cs + irradiation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 229, Issue 1, 2005, Pages 35-45

  Van Der Heide, P A W ^a  

^a University of Houston   (United States)

Author keywords

Collective oscillations; Electron transfer; Ion solid interactions; Secondary ion mass spectrometry; Work function measurements

Indexed keywords

CHARGE TRANSFER; ELECTRON TUNNELING; FERMI LEVEL; ION BEAMS; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; SUBSTRATES;

COLLECTIVE OSCILLATIONS; FERMI EDGE; ION-SOLID INTERACTION; WORK FUNCTION MEASUREMENTS;

CESIUM;

EID: 15744391969     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.10.091     Document Type: Article

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