Proximity effects and VLSI design

2005 International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2005, Pages 167-170

  Hook, Terence B ^a   Brown, Jeff ^a   Tian, Xiaowei ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25844444121     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icicdt.2005.1502622     Document Type: Conference Paper

References (8)

1. T. Hook et al., IEEE Transactions on Electron Devices, vol. 50, no. 9, 200, pp. 1946-1951.
2. R. Mann et al., IBM Journal of Res. Dev., Vol. 57, No. 5/6, 200, pp. 55-566.
3. T. Hook et al., IEEE Transactions on Electron Devices, vol. 49, no. 9, 2002, p 162 -1627.
4. P. Singh et al., Bulletin of Materials Science, vol. 22, no., 1999, p 5-62
5. Momose et al., IEDM, 1990, p.65.
6. G. Franz et al., Applied Physics, vol. 2, no. 1, 1980, pp. 107-112
7. T. Hook et al., IEEE Electron Device Letters, vol. 21, no. 2, 2000, pp 85-87.
8. T. Hook, IEEE Transactions on Semiconductor Manufacturing, vol. 12, no., 1999, p 81-82.