Comparison between PZT thin films deposited on stainless steel and on platinum/silicon substrate

Journal of Physics: Conference Series

Volumn 94, Issue 1, 2008, Pages

  Stancu, V ^a   Sava, F ^a   Lisca, M ^a   Pintilie, L ^a,b   Popescu, M ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38949124002     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/94/1/012012     Document Type: Article

References (28)

1. Scott J F 2000 Ferroelectric Memories, in Advanced Microelectronics Series ed Itoh K and T Sakurai (Springer-Verlag Berlin Heidelberg)
2. Uchino K 2000 Ferroelectric Devices (Marcel Dekker, New York)
3. Li X, J D N Cheeke, Z Wang, C K Jen, M Viens, G Yi and M Sayer 1995 Appl. Phys. Lett. 67 37
4. Beerman H P 1971 Ferroelectrics 2 123
5. Polla D L, P I Schiller 1995 Integrated Ferroelectrics 7 359
6. Chen H D, K R Udayakumayer, C J Gaskey, L E Cross 1996 J. Am. Ceram. Soc. 79 2189
7. Van Lintel H, F Vander Pohl, S Boustra 1988 Sensor Actuat. 15 153
8. Tohge N, S Takahashi, T Minami 1989 Am. Ceram. Proc. Symp. Proc vol 152 p 227
9. Dawber M, K M Rabe, J F Scott 2005 Rev. Mod. Phys. 77 1
10. Klee M, R Eusemann, R Waser, W Brand and H van Haal 1992 J. Appl. Phys. 72 1566
11. Tagantsev A K, I Stolichnov, E L Colla and N Setter 2001 J. Appl. Phys. 90 1387
12. Jin-Rong Cheng, Wenyi Zhu, Nan Li and L Eric Cross 2002 Appl. Phys. Lett. 81 4805
13. Tsakalakos L and T Sands 2000 Appl. Phys. Lett. 76 227
14. Sviridov E, R Le Bihan, S F Liateni and A Désécures 1998 Appl. Phys. Lett. 73 3953
15. Cheng J R, W Zhu, N Li, L E Cross 2002 Appl. Phys. Lett. 81 4805-4807
16. Chang D-A, Y-H Choh, W F Hsieh, P Lin, T-Y Tseng 1993 J. Mater. Sci. 28 6691-6698
17. Klissurska R D, K G Brooks, I M Reaney, C Z Pawlaczyk, M Kosec, N Setter 1995 J. Am. Ceram. Soc. 78 1513
18. Chapin L N, S A Meyers 1990 Mater. Res. Symp. Proc. 200 153
19. Dawber M and J F Scott 2000 Appl. Phys. Lett. 76 1060
20. Nanjo H, R C Newman and N Sanada 1997 Appl. Surface Sci. 121-122 253
21. Pintilie L and M Alexe 2005 J. Appl. Phys. 98 124103
22. Pintilie L, I Boerasu, M J M Gomes, T Zhao, R Ramesh and M Alexe 2005 J. Appl. Phys. 98 124104
23. Pintilie L, M Lisca and M Alexe 2005 Appl. Phys. Lett. 86 192902
24. Schroeder D K 1998 Semiconductor material and device characterization (Wiley-Interscience, New York)
25. Vrejoiu I, G Le Rhun, L Pintilie, D Hesse, M Alexe and U Goesele 2006 Advanced Materials 18 1657
26. Popescu M, F Sava s Georgescu, L Gheorghe, I N Mihailescu, R Cristescu, G Socol, H Bradaczek 2002 J. Optoelectron. Advanced Mater. 4 (3) 813
27. Wood W A, W A Rachinger 1949 J. Inst. Metals 75 571
28. Stancu V, F Sava, M Lisca, L Pintilie, M Popescu 2007 J. Optoelectron. Advanced Mater. 9 (9) 2967