메뉴 건너뛰기




Volumn 4, Issue 3, 2002, Pages 813-818

Thin films of langasite (La3Ga5SiO14) prepared by pulsed laser deposition

Author keywords

Amorphous; Crystallization; Langasite; Pulsed laser deposition; X ray diffraction

Indexed keywords

AMORPHOUS SILICON; FILM PREPARATION; GALLIUM COMPOUNDS; PULSED LASER DEPOSITION; PULSED LASERS; SILICON COMPOUNDS; SILICON WAFERS; THIN FILMS;

EID: 33947400134     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (11)
  • 11
    • 0344077019 scopus 로고
    • X-ray line shape analysis. A means for the Characterization of Crystalline Polymers
    • Springer-Verlag, Berlin, Heidelberg
    • G. Bodor, “X-ray Line Shape Analysis. A means for the Characterization of Crystalline Polymers” in Advances in Polymer Science, Vol. 67, p. 165, Springer-Verlag, Berlin, Heidelberg, 1985.
    • (1985) Advances in Polymer Science , vol.67 , pp. 165
    • Bodor, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.