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Volumn 81, Issue 25, 2003, Pages 4805-4807

Electrical properties of sol-gel-derived Pb(Zr0.52Ti0.48) O3 thin films on a PbTiO3-coated stainless steel substrate

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; LEAD COMPOUNDS; PERMITTIVITY; PEROVSKITE; POLARIZATION; SOL-GELS; THIN FILMS; X RAY DIFFRACTION;

EID: 0037449323     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1528288     Document Type: Article
Times cited : (54)

References (13)
  • 13
    • 0004219108 scopus 로고
    • Shanghai Science and Technology, Shanghai, [in Chinese]
    • Xixin Qu, Thin Film Physics (Shanghai Science and Technology, Shanghai, 1986), p. 124 [in Chinese].
    • (1986) Thin Film Physics , pp. 124
    • Qu, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.