SCOPUS 정보 검색 플랫폼

Volumn 92, Issue 4, 2008, Pages

High temperature surface imaging using atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GROWTH (MATERIALS); HIGH TEMPERATURE EFFECTS; MOLECULAR DYNAMICS; SURFACE MORPHOLOGY;

ATOMIC STEP RESOLUTION; OPERATING TEMPERATURE;

NANOTECHNOLOGY;

EID: 38849095957 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2836943 Document Type: Article

Times cited : (29)

References (12)

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- The maximum applied potential (330 V) in combination with the electrode distance of ∼1 mm prevents voltage breakdown in the pressure range of interest (10-6 - 103 mbar). See, for instance, Breakdown of Gases, edited by J. M. Meek and J. D. Craggs (Wiley, New York).
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